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Reliability Physics and Engineering : Time-To-Failure Modeling

フォーマット:
電子ブック
責任表示:
by J.W. McPherson
言語:
英語
出版情報:
Boston, MA : Springer US : Imprint: Springer, 2010
形態:
XIII, 318 p
著者名:
目次情報:
Materials and Device Degradation
From Material/Device Degradation to Time-To-Failure
Time-To-Failure Modeling
Gaussian Statistics ? An Overview
Time-To-Failure Statistics
Failure Rate Modeling
Accelerated Degradation
Acceleration Factor Modeling
Ramp-to-Failure Testing
Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits
Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering
Conversion of Dynamical Stresses into Effective Static Values
Increasing the Reliability of Device/Product Designs
Erratum to: Materials and Device Degradation
Materials and Device Degradation
From Material/Device Degradation to Time-To-Failure
Time-To-Failure Modeling
Gaussian Statistics ? An Overview
Time-To-Failure Statistics
Failure Rate Modeling
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書誌ID:
LB00386825
ISBN:
9781441963475 [1441963472]  CiNii Books  Webcat Plus  Google Books
9781441963482 [1441963480]  CiNii Books  Webcat Plus  Google Books
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